AL-JAWADI, Ahmed S.; YASEEN, Mohammad Tariq; NAJIM, Qais Thanon. Challenges and Prospects of Nanoscale MOSFET Scaling: A Review. Anbar Journal of Engineering Sciences, [S. l.], v. 16, n. 2, p. 117–128, 2025. DOI: 10.37649/AJES-25-018. Disponível em: https://ajes.journalpath.com/index.php/ajes/article/view/643. Acesso em: 16 dec. 2025.